TEM Microstructure Analysis for Compressively Stressed BaTiO3 Thin Films by Bottom Oxide Electrodes
- 著者名
- K. Murakoshi, K. Fukamachi, N. Sakamoto, T. Ohno, D.S.Fu, T. Kiguchi, T. Matsuda, T. Konno, N. Wakiya and H. Suzuki
- 論文題目
- TEM Microstructure Analysis for Compressively Stressed BaTiO3 Thin Films by Bottom Oxide Electrodes
- 雑誌名
- The 29th International Korea- Japan Seminar on Ceramics
- 雑誌 巻・号・項
- (2012 Nov.21-24 ) pp.162-163
- 発行年
- 2012