Stress state analysis of stress engineered BaTiO3 thin film by LaNiO3 bottom electrode
- 著者名
- K, Murakoshi, K. Fukamachi, N. Sakamoto, T. Ohno, T. Kiguchi, T. Matsuda, T. Konno, N. Wakiya and H. Suzuki
- 論文題目
- Stress state analysis of stress engineered BaTiO3 thin film by LaNiO3 bottom electrode
- 雑誌名
- J. Ceram. Soc. Jpn.
- 雑誌 巻・号・項
- 121 273-277
- 発行年
- 2013