TEM Microstructure Analysis for Compressively Stressed PZT Thin Film by CSD Derived LaNiO3 Bottom Electrodes
- 著者名
- K. Ozawa, M. Ishizuka, N. Sakamoto T. Ohno, T. Kiguchi, T. Matsuda T. Konno, N. Wakiya and H. Suzuki
- 論文題目
- TEM Microstructure Analysis for Compressively Stressed PZT Thin Film by CSD Derived LaNiO3 Bottom Electrodes
- 雑誌名
- Functional Mater. Lett.
- 雑誌 巻・号・項
- 5(2) 1260016
- 発行年
- 2012
